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Accurately mapping global wheat production system using deep learning algorithms

Tietueen suppeat tiedot
dc.contributor.authorLuo, Yuchuan
dc.contributor.authorZhang, Zhao
dc.contributor.authorCao, Juan
dc.contributor.authorZhang, Liangliang
dc.contributor.authorZhang, Jing
dc.contributor.authorHan, Jichong
dc.contributor.authorZhuang, Huimin
dc.contributor.authorCheng, Fei
dc.contributor.authorTao, Fulu
dc.contributor.departmentid4100311110
dc.contributor.organizationLuonnonvarakeskus
dc.date.accessioned2023-01-11T06:57:53Z
dc.date.accessioned2025-05-28T14:04:31Z
dc.date.available2023-01-11T06:57:53Z
dc.date.issued2022
dc.description.vuosik2022
dc.format.bitstreamfalse
dc.format.pagerange10 p.
dc.identifier.olddbid495508
dc.identifier.oldhandle10024/552949
dc.identifier.urihttps://jukuri.luke.fi/handle/11111/24624
dc.language.isoen
dc.okm.corporatecopublicationei
dc.okm.discipline4111
dc.okm.internationalcopublicationon
dc.okm.openaccess2 = Hybridijulkaisukanavassa ilmestynyt avoin julkaisu
dc.okm.selfarchivedei
dc.publisherElsevier BV
dc.relation.articlenumber102823
dc.relation.doi10.1016/j.jag.2022.102823
dc.relation.ispartofseriesInternational Journal of Applied Earth Observation and Geoinformation
dc.relation.issn1569-8432
dc.relation.volume110
dc.source.identifierhttps://jukuri.luke.fi/handle/10024/552949
dc.subjectWheat
dc.subjectCrop mapping
dc.subjectYield estimation
dc.subjectDeep learning
dc.subjectRemote sensing
dc.tehOHFO-EI-OHFO
dc.titleAccurately mapping global wheat production system using deep learning algorithms
dc.typepublication
dc.type.okmfi=A2 Katsausartikkeli tieteellisessä aikakauslehdessä|sv=A2 Översiktsartikel i en vetenskaplig tidskrift|en=A2 Review article, Literature review, Systematic review|

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