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Simultaneous X-ray diffraction and X-ray fluorescence microanalysis on secondary xylem of Norway spruce

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dc.contributor.authorPirkkalainen, K.-
dc.contributor.authorPeura, M.-
dc.contributor.authorLeppänen, K.-
dc.contributor.authorSalmi, A.-
dc.contributor.authorMeriläinen, A.-
dc.contributor.authorSaranpää, P.-
dc.contributor.authorSerimaa, R.-
dc.contributor.departmentMetsäntutkimuslaitos-
dc.date.accessioned2015-06-25T10:41:47Z
dc.date.accessioned2025-05-29T02:26:25Z
dc.date.available2015-06-25T10:41:47Z
dc.date.created03-mar-2012 00:00:00-
dc.date.issued2012-
dc.format.bitstreamfalse
dc.format.pagerange1113-1125-
dc.identifier.bibliographicCitationPirkkalainen, K., Peura, M., Leppänen, K., Salmi, A., Meriläinen, A., Saranpää, P. & Serimaa, R. 2012. Simultaneous X-ray diffraction and X-ray fluorescence microanalysis on secondary xylem of Norway spruce. Wood Science and Technology 46: 1113-1125.-
dc.identifier.olddbid458580
dc.identifier.oldhandle10024/517042
dc.identifier.urihttps://jukuri.luke.fi/handle/11111/52787
dc.language.isoeng-
dc.lukeperson12410-
dc.metlaperson544-
dc.metlasuorite77220-
dc.publisher.countryDE-
dc.relation.doi10.1007/s00226-012-0474-y-
dc.relation.ispartofseriesWood Science and Technology-
dc.relation.issn0043-7719-
dc.relation.volume46-
dc.source.identifierhttps://jukuri.luke.fi/handle/10024/517042
dc.subject.keywordPicea abies-
dc.subject.keywordmikrofibrillikulma-
dc.subject.keywordpuuaine-
dc.subject.keywordravinteet-
dc.subject.keywordröntgendiffraktio-
dc.subject.keywordröntgenfluoresenssi-
dc.teh3453-
dc.titleSimultaneous X-ray diffraction and X-ray fluorescence microanalysis on secondary xylem of Norway spruce-
dc.type.okmfi=A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä|sv=A1 Originalartikel i en vetenskaplig tidskrift|en=A1 Journal article (refereed), original research|-

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