Prediction of yield losses using relative leaf area models - Lotz, L.A.P.; Christensen, C.; Cloutier, D.; Fernandez Quintanilla, C.; Legere, A.; Lemieux, A.; Lutman, P.J.W.; Pardo Iglesias, A.; Salonen, Jukka; Sattin, m.; Stigliani, L.; Tei, F. (dk, 1996)